Oka, Nobuyo and Chia, Yee Ooi and Ichihara, Hideyuki and Inoue, Tomoo and Fujiwara, Hideo (2007) An extended class of acyclically testable circuits. In: IEEE 8th Workshop on RTL and High Level Testing, 2007, Beijing, China.
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Abstract
This paper introduces a new class of sequential circuits called acyclically testable sequential circuits which is wider than the class of acyclic sequential circuits but whose test generation complexity is equivalent to that of the acyclic sequential circuits. We also present a test generation procedure for acyclically testable sequential circuits and elaborate a design-for-test (DFT) method to augment an arbitrary sequential circuit into an acyclically testable sequential circuit.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | extended class, acyclically testable circuits |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 13732 |
| Deposited By: | Liza Porijo |
| Deposited On: | 11 Aug 2011 03:33 |
| Last Modified: | 14 Sep 2017 04:03 |
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