Oka, Nobuyo and Chia, Yee Ooi and Ichihara, Hideyuki and Inoue, Tomoo and Fujiwara, Hideo (2007) An extended class of acyclically testable circuits. In: IEEE 8th Workshop on RTL and High Level Testing, 2007, Beijing, China.
Full text not available from this repository.
| Item Type: | Conference or Workshop Item (Paper) |
|---|---|
| Uncontrolled Keywords: | extended class, acyclically testable circuits |
| Subjects: | T Technology > TK Electrical engineering. Electronics Nuclear engineering |
| Divisions: | Electrical Engineering |
| ID Code: | 13732 |
| Deposited By: | Liza Porijo |
| Deposited On: | 11 Aug 2011 03:33 |
| Last Modified: | 08 Oct 2012 06:27 |
Repository Staff Only: item control page
