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An extended class of acyclically testable circuits

Oka, Nobuyo and Chia, Yee Ooi and Ichihara, Hideyuki and Inoue, Tomoo and Fujiwara, Hideo (2007) An extended class of acyclically testable circuits. In: IEEE 8th Workshop on RTL and High Level Testing, 2007, Beijing, China.

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Item Type:Conference or Workshop Item (Paper)
Uncontrolled Keywords:extended class, acyclically testable circuits
Subjects:T Technology > TK Electrical engineering. Electronics Nuclear engineering
Divisions:Electrical Engineering
ID Code:13732
Deposited By: Liza Porijo
Deposited On:11 Aug 2011 03:33
Last Modified:08 Oct 2012 06:27

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