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Electrical characterization of the high speed I/O data bus using cross correlation method

Since, H. J. H. and Shaameri, A. Z. and Yew, T. G. (2007) Electrical characterization of the high speed I/O data bus using cross correlation method. In: Icept: 2007 8Th International Conference On Electronics Packaging Technology, Proceedings. IEEE, New York, USA, pp. 240-243. ISBN 978-1-4244-1391-1

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Official URL: http://dx.doi.org/10.1109/ICEPT.2007.4441420

Abstract

High speed data transportation between the CPU and peripherals on the PC motherboard is needed to support heavy data traffic such as multimedia, games and broadband networks. At multi Gbits/sec high speed, impedance mismatch between the CPU and peripherals becomes critical and limits the possible maximum throughput. The I/O transportation bus can be modeled as a linear time invariant system. The output signal at the receiver is the convolution function of the transfer function and transmitter signal. Due to the complexity of the motherboard ingredient, it is desired to model the I/O bus in black box behavior model. Instead of using traditional passive measurement method such as Time Domain Reflectometry (TDR) and Scattering parameter measurement, cross correlation method is used to find out the impulse response transfer function when the I/O Bus is active. By using MATLAB and SPICE tools, the method is simulated to understand its accuracy and robustness under noisy environment.

Item Type:Book Section
Additional Information:8th International Conference on Electronics Packaging Technology Shanghai, PEOPLES R CHINA, AUG 14-17, 2007
Uncontrolled Keywords:S-parameters, reflectometry, system buses
Subjects:Q Science > QA Mathematics > QA75 Electronic computers. Computer science
Q Science > QA Mathematics > QA76 Computer software
Divisions:Electrical Engineering
ID Code:11687
Deposited By: Nor Asmida Abdullah
Deposited On:14 Jan 2011 01:43
Last Modified:14 Jan 2011 01:43

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